Speaker: Dr. Andrey Matsko
Affiliation: OE Waves – The Optical Society

Abstract:  Chip-scale structures are becoming indispensable in modern world, and there is an increasing need for miniaturization of metrology sensors and devices. Since a direct reduction of size by scaling associated components is usually not feasible, new architectures must be developed. This, however, is a challenging task posing a question about both usefulness and viability of such a transformation.  In this presentation, we review recent achievements of OEwaves in both theoretical and experimental studies pertaining to miniaturization and integration of various metrology devices including clocks, oscillators, gyroscopes, external cavity lasers (both conventional semiconductor and QCL), RF and microwave sensors and receivers. We show that while size reduction improves power consumption, environmental stability, nonlinear conversion efficiency, and sensitivity, it also results in a rather significant increase in the associated fundamental and technical noise, which limits the ultimate achievable performance.  This observation demands further investigation of the subject to aid in the development of optimal electromagnetic chip scale devices used in metrology.

Biography: Dr. Andrey Matsko has actively worked in the fields of quantum and nonlinear optics, electromagnetics, and quantum measurement theory since 1997. He has received several prizes in the field, and authored and coauthored more than a 160 peer-reviewed papers as well as 41 US Patents. As the lead scientist at OEwaves Inc (2008-present), Dr. Matsko is responsible for various business-development activities and theoretical R&D efforts in general electromagnetics. As the Principal Member of Technical Staff, Jet Propulsion Laboratory, California Institute of Technology (2001 to 2008), Dr. Matsko was primarily involved in RF photonics studies. Prior that he was involved in Quantum Optics as well as Fundamental Quantum Mechanics studies. He is a Fellow of OSA, with an h-index of 53.

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Date/Time:
Date(s) - Apr 24, 2017
1:00 pm - 2:00 pm

Location:

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