BEGIN:VCALENDAR
PRODID:-//AT Content Types//AT Event//EN
VERSION:1.0
BEGIN:VEVENT
DTSTART:20090428T170000Z
DTEND:20090428T190000Z
DCREATED:20110202T232113Z
UID:ATEvent-2900fae262e7aa223a5615c65d106f54
SEQUENCE:0
LAST-MODIFIED:20110215T021918Z
SUMMARY:Uncertainties Modeling and Statistical Optimization for Power Integrity of VLSI Circuits and Systems
LOCATION:Engr IV Room 57-124
PRIORITY:3
TRANSP:0
END:VEVENT
END:VCALENDAR