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High-Performance Lateral-Actuating Magnetic MEMS Switch
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| When |
May 24, 2010 from 02:30 PM to 03:30 PM |
| Where | Engr. IV Archives Room 53-135E |
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Michael Glickman
Advisor: Jack Judy
Monday, May 24, 2010 at 2:30pm
Engr. IV Archives Room 53-135E
Abstract:
Traditional relays are used to switch electrical current in applications
where outstanding off-isolation, linearity, and low on-resistance are
important. Solid-state switches have much poorer off-isolation and
linearity, but are smaller, faster, and use less power than traditional
relays. In contrast, MEMS switches have the capability of attaining the
high off-state isolation, linearity, and low on-state resistance of the
bulky traditional relay, while being faster, smaller, lighter, and
potentially less costly. A variety of MEMS switches using electrostatic
forces, electrothermal expansion forces, and magnetic forces have been
developed. Electrostatically actuated MEMS switches are easy to
fabricate, and thus have been the most commonly demonstrated type of
MEMS switch, but their utility has been limited by high actuation
voltages, limited displacement (and thus limited off-isolation), and
typically employ CMOS-incompatible fabrication processes, such as
high-temperature (600 C) polysilicon deposition. Electrothermally
actuated switches tend to be the slowest type of switches and use the
most power, but provide the most contact force -- which is important for
achieving a low contact resistance. Although magnetostatically actuated
MEMS switches offer much larger displacements and have greater contact
force than electrostatically actuated MEMS switches, they are slower,
larger, consume much more power, and are often not produced with
CMOS-compatible fabrication processes.
This work demonstrates a high-performance magnetostatic MEMS-switch that retains the high force (200 micro-Newtons) and long actuation distances (7.7 microns) of magnetostatic switches, while using less than 13 mW to actuate. We have a developed 3-D solenoidal coil patterning method over a ferromagnetic core to reduce the power loss and die-area cost of planar windings. We have also developed an electroplating process to deposit NiFe 80/20 with a permeability of approximately 8500, thus allowing for the very low power input requirements of the switch. The completed switch has been tested to over 3 million cycles while maintaining a contact resistance of 0.1 -- 0.4 ohms. We have combined Schwartz-Christoffel mapping with magnetic equivalent circuits to create highly accurate models 1000X faster than the finite element method. The process is the first published fully-integrated UV-MEMS magnetic-switch to use horizontal actuation, which allows for future use of wiping contacts that reduce contact resistance. The process does not etch into the bulk of wafer, which allows it to be easily integrated with any III-V or CMOS wafer.
Biography:
Michael Glickman received his B.S. Degree in Electrical Engineering from
Yale University, New Haven, CT in 2004, and the M.S. Degree in
Electrical Engineering (Physical & Wave Electronics) from University
of California, Los Angeles (UCLA) in 2008. He is currently a Ph.D.
candidate with Prof. Jack Judy in the Department of Electrical
Engineering, University of California, Los Angeles.
