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Home Events Events Archive 2013 A CMOS Image Sensor for In-Pixel Background Suppression and Frequency and Phase Detection for Structured Light 3-D Acquisition Systems

A CMOS Image Sensor for In-Pixel Background Suppression and Frequency and Phase Detection for Structured Light 3-D Acquisition Systems

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What
  • Visitor Seminars
When Jun 17, 2013
from 10:00 AM to 11:00 AM
Where Engr. IV Bldg., Maxwell Room 57-124
Contact Name
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Hiroki Yabe

The University of Tokyo

 

Abstract

We designed and demonstrated the operation of a CMOS image sensor for modulated light detection and frequency and phase detection. These two quantities can be used to code the angular information in an active 3-D acquisition method based on structured light. Each pixel is equipped with a pulse-frequency modulator (PFM) [1] and two up/down counters in order to perform frequency and phase calculation in pixel parallel. The sensor is also capable of obtaining gray scale images by turning off the phase calculation. The sensor is fabricated in 65nm standard CMOS. A 45_30 array of 28_m_37_m pixels is integrated on a 2 mm_2 mm die. The measurement results show signal-to- background ratio (SBR= 10 log(signal/background)) of 5.5dB at the frame rate of 10 fps, and maximally -21dB at slower rate. We have demonstrated the demodulated 2-D image, the results of distance measurement with range accuracy of 0.68cm at the average distance 18-24cm and reconstructed shape using this sensor.

 

Biography

Hiroki Yabe was born in Saitama, Japan, on January 22, 1989. He received the B.S. and the M.S. degrees in electronic engineering from the University of Tokyo in 2011 and 2013, respectively. He is currently pursuing the Ph.D. degree in electronic engineering at the University of Tokyo. His current research interests include architecture and design of smart image sensors for 3-D imaging.

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